Interpretation of optical diagnostics for the analysis of laser crystallization of amorphous silicon films

Microscale Thermophysical Engineering

Volumn 4, Issue 1, 2000, Pages 25-38

  Moon, Seungjae ^a   Lee, Minghong ^a   Hatano, Mutsuko ^a,b   Grigoropoulos, Costas P ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034420267     PISSN: 10893954     EISSN: 10893954     Source Type: Journal    
DOI: 10.1080/108939500199619     Document Type: Article

References (19)

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