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Volumn 42, Issue 3-5, 2001, Pages 185-188

Noise gain vs. Capture probability in single quantum well infrared photodetectors at low bias voltages

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR QUANTUM WELLS; SPURIOUS SIGNAL NOISE; THRESHOLD VOLTAGE;

EID: 0035368590     PISSN: 13504495     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4495(01)00075-5     Document Type: Article
Times cited : (5)

References (17)
  • 15
    • 0003663467 scopus 로고
    • Probability, Random Variables and Stochastic Processes
    • McGraw-Hill
    • A. Papoulis, Probability, Random Variables and Stochastic Processes, Electrical Enginering, McGraw-Hill, 1984, p. 136.
    • (1984) Electrical Enginering , pp. 136
    • Papoulis, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.