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Volumn 42, Issue 3-5, 2001, Pages 185-188
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Noise gain vs. Capture probability in single quantum well infrared photodetectors at low bias voltages
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CURRENTS;
ELECTRIC FIELD EFFECTS;
SEMICONDUCTOR DEVICE MODELS;
SEMICONDUCTOR QUANTUM WELLS;
SPURIOUS SIGNAL NOISE;
THRESHOLD VOLTAGE;
QUANTUM WELL INFRARED PHOTODETECTORS (QWIP);
INFRARED DETECTORS;
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EID: 0035368590
PISSN: 13504495
EISSN: None
Source Type: Journal
DOI: 10.1016/S1350-4495(01)00075-5 Document Type: Article |
Times cited : (5)
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References (17)
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