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Volumn 12, Issue 2, 2001, Pages 136-142

Status and perspectives of nanoscale device modelling

(10) Macucci, M a Iannaccone, G a Greer, J b Martorell, J c Sprung, D W L d Schenk, A e Yakimenko, I I f Berggren, K F f Stokbro, K g Gippius, N h

a UNIVERSITY OF PISA (Italy)

b UNIVERSITY COLLEGE CORK (Ireland)

c UNIVERSITY OF BARCELONA (Spain)

d MCMASTER UNIVERSITY (Canada)

e ETH ZURICH (Switzerland)

f LINKÖPING UNIVERSITY (Sweden)

g TECHNICAL UNIVERSITY OF DENMARK (Denmark)

h PROKHOROV GENERAL PHYSICS INSTITUTE (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC BREAKDOWN; QUANTUM THEORY; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES;

NANOSCALE DEVICE MODELLING;

NANOTECHNOLOGY;

EID: 0035356889 PISSN: 09574484 EISSN: None Source Type: Journal
DOI: 10.1088/0957-4484/12/2/313 Document Type: Conference Paper

Times cited : (20)

References (26)

1
- 0000881956
- (2000) Phys. Rev. Lett. , vol.84 , pp. 2921
- Roland, C.¹ Nardelli, M.B.² Wang, J.³ Guo, H.⁴

2
- 4243992554
- (1992) Phys. Rev. B , vol.45 , pp. 8542
- Knäbchen, A.¹

3
- 0003617884
- Hong Kong, August
- (1999) Proc. 15th Int. Conf. on Noise in Physical Systems and 1/f Fluctuations , pp. 325
- Macucci, M.¹ Iannaccone, G.² Pellegrini, B.³

4
- 21544433131
- (1989) J. Appl. Phys. , vol.66 , pp. 3892
- Sols, F.¹ Macucci, M.² Ravaioli, U.³ Hess, K.⁴

5
- 0000546326
- (1995) Phys. Rev. B , vol.52 , pp. 5210
- Macucci, M.¹ Galick, A.² Ravaioli, U.³

6
- 0000348326
- (1992) Phys. Rev. B , vol.46 , pp. 1889
- Beenakker, C.W.J.¹ Büttiker, M.²

7
- 0032595717
- (1999) J. Phys.: Condens. Matter. , vol.11 , pp. 6035
- Lugli, P.¹ Di Carlo, A.² Reale, A.³

8
- 0032313253
- (1998) Thin Solid Films , vol.336 , pp. 145
- Iannaccone, G.¹ Ungarelli, C.² Macucci, M.³ Amirante, E.⁴ Governale, M.⁵

9
- 0001051084
- (1993) Phys. Rev. Lett. , vol.70 , pp. 1311
- Field, M.¹ Smith, C.G.² Pepper, M.³ Ritchie, D.A.⁴ Frost, J.E.F.⁵ Jones, G.A.C.⁶ Hasko, D.G.⁷

10
- 0034187150
- (2000) Superlattices Microstructures , vol.27 , pp. 369
- Iannaccone, G.¹ Macucci, M.² Amirante, E.³ Jin, Y.⁴ Launois, H.⁵ Vieu, C.⁶

11
- 0003691685
- Preprint cond-mat/0011264
- Martorell, J.¹ Sprung, D.W.L.² Machado, P.A.³ Smith, C.G.⁴

12
- 0000359335
- (1988) Phys. Rev. B , vol.38 , pp. 9945
- Ko, D.Y.K.¹ Inkson, J.C.²

13
- 0000722242
- (1999) J. Appl. Phys. , vol.85 , pp. 2962
- Governale, M.¹ Macucci, M.² Iannaccone, G.³ Ungarelli, C.⁴ Martorell, J.⁵

14
- 0032164821
- (1998) IEEE Trans. Electron Devices , vol.45 , pp. 1960
- Stolk, P.A.¹ Widdershoven, F.P.² Klaassen, D.B.M.³

15
- 0032320827
- (1998) IEEE Trans. Electron Devices , vol.45 , pp. 2505
- Asenov, A.¹

16
- 4244197929
- (1998) Phys. Rev. Lett. , vol.81 , pp. 3515
- Lang, N.D.¹ Avouris, Ph.²

17
- 0000042026
- (2000) Appl. Phys. Lett. , vol.76 , pp. 3448
- Di Ventra, M.¹ Pantelides, S.T.² Lang, N.D.³

18
- 0003527969
- submitted
- (2000) MRS Proc. Symp. D
- Brandbyge, M.¹ Stokbro, K.² Taylor, J.³ Mozos, J.L.⁴ Ordejon, P.⁵

19
- 4243502667
- to be published
- (2001) Phys. Rev. B
- Taylor, J.¹ Guo, H.² Wang, J.³

20
- 0003544078
- Ab initio approaches to microelectronics materials and process modelling
- (2000) Mater. Sci. Semiconductor Processing , vol.3 , Issue.SPEC. ISSUE
- Greer, J.C.¹ Ihara, S.² Vrotsos, T.³

21
- 0000480579
- (2000) J. Chem. Phys. , vol.112 , pp. 1510
- Hall, L.E.¹ Reimers, J.R.² Hush, N.S.³ Silverbrook, K.⁴

22
- 0034514201
- (2000) Nanotechnology , vol.11 , pp. 318
- Bychkov, A.M.¹ Yakimenko, I.I.² Berggren, K.F.³

23
- 0001496026
- (1996) Phys. Rev. Lett. , vol.77 , pp. 135
- Thomas, K.J.¹ Nicholls, J.T.² Simmons, M.Y.³ Pepper, M.⁴ Mace, D.R.⁵ Ritchie, D.A.⁶

24
- 0001410323
- (1998) Phys. Rev. B , vol.58 , pp. 4846
- Thomas, K.J.¹ Nicholls, J.T.² Appleyard, N.J.³ Simmons, M.Y.⁴ Pepper, M.⁵ Mace, D.R.⁶ Tribe, W.R.⁷ Ritchie, D.A.⁸

25
- 0009906761
- (2000) Phys. Rev. B , vol.62
- Schmidt, G.¹ Ferrand, D.² Molenkamp, L.W.³ Filip, A.T.⁴ Van Wees, B.J.⁵

26
- 0033576696
- (1999) Nature , vol.402 , pp. 787
- Fiederling, R.¹ Keim, M.² Reuscher, G.³ Ossau, W.⁴ Schmidt, G.⁵ Waag, A.⁶ Molenkamp, L.W.⁷

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