Heavy ion irradiation induced effects in Ni3N/Al bilayers

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 178, Issue 1-4, 2001, Pages 297-300

  Dhar, S ^a   Rissanen, L ^a   Engel, K ^a   Wenderoth, M ^a   Lieb, K P ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; INTERFACES (MATERIALS); NICKEL COMPOUNDS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SURFACE ROUGHNESS; SURFACE TREATMENT; X RAY DIFFRACTION ANALYSIS;

ION BEAM IRRADIATION; RESONANT NUCLEAR REACTION ANALYSIS;

ION BEAMS;

EID: 0035337056     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00509-2     Document Type: Conference Paper

References (12)