Polycrystalline mercuric iodide detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3770, Issue , 1999, Pages 146-155

  Schieber, M ^a   Hermon, H ^a   Zuck, A ^a   Vilensky, A ^a   Melekhov, L ^a   Shatunovsky, R ^a   Meerson, E ^a   Saado, H ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; GRAIN SIZE AND SHAPE; MERCURY COMPOUNDS; POLYCRYSTALLINE MATERIALS; SENSITIVITY ANALYSIS; VAPOR DEPOSITION; X RAY ANALYSIS; X RAY RADIOGRAPHY;

CURRENT INTEGRATION MODE; DARK CURRENT; MERCURIC IODIDE DETECTORS; PHYSICAL VAPOR PHASE DEPOSITION; RADIOLOGICAL X RAY GENERATOR; X RAY RESPONSE;

THICK FILM DEVICES;

EID: 0033314545     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.368177     Document Type: Conference Paper

References (21)