Correlation between nuclear response and defects in CZT

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3768, Issue , 1999, Pages 138-146

  Hermon, H ^a   Schieber, M ^a   James, R B ^a   Lee, E ^a   Cross, E ^a   Goorsky, M ^a   Lam, T ^a   Schlesinger, T E ^a   Greaves, M ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL GROWTH; EMISSION SPECTROSCOPY; GAMMA RAY SPECTROMETERS; INFRARED SPECTROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR DEVICES; SEMICONDUCTOR GROWTH; THERMOELECTRICITY; X RAY CRYSTALLOGRAPHY; X RAY SPECTROMETERS;

BRIDGMAN METHOD; CADMIUM ZINC TELLURIDE; INFRARED TRANSMISSION SPECTROSCOPY; SEMICONDUCTOR DETECTORS; THERMOELECTRIC EMISSION SPECTROSCOPY (TEES); TRANSIENT CHARGE TECHNIQUE (TCT); TRIAXIAL DOUBLE CRYSTAL X RAY DIFFRACTION (TADXRD) ANALYSIS;

RADIATION DETECTORS;

EID: 0033311170     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.366577     Document Type: Conference Paper

References (16)