Influence of microstructural parameters on dielectric properties of polycrystalline alumina

Proceedings of the International Conference on Electric Charge in Solid Insulators, CSC

Volumn , Issue , 1998, Pages 391-400

  Liebault, J ^a   Bigarre, J ^a   Treheux, D ^a   Goeuriot, D ^a   Thevenot, F ^a  

^a ECOLE DES MINES DE SAINT ETIENNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CERAMIC MATERIALS; CRYSTAL MICROSTRUCTURE; DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC INSULATION TESTING; GRAIN SIZE AND SHAPE; POLYCRYSTALLINE MATERIALS; POROSITY; SINGLE CRYSTALS; ZIRCONIA;

CHARGE TRAPPING/DETRAPPING; CURRENT BREAKDOWN TESTS; DIELECTRIC STRENGTH;

ELECTRIC INSULATING MATERIALS;

EID: 0031622009     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)