Overdamped NbN junctions with Nb/AlOx/Nb multilayered barriers

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 72-75

  Akaike, Hiroyuki ^a   Iwai, Takao ^a   Ninomiya, Yasunori ^a   Nakamura, Kouzou ^a   Fujimaki, Akira ^a   Hayakawa, Hisao ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Nb AlOx Nb multilayered barriers; NbN junctions; Overdamped junctions; Single flux quantum circuits

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DIGITAL CIRCUITS; ELECTRIC PROPERTIES; MULTILAYERS; NIOBIUM COMPOUNDS; OXIDATION; THICKNESS MEASUREMENT;

FLUX QUANTUM CIRCUITS; MULTILAYERED BARRIERS; NIOBIUM NITROGEN COMPOUNDS; ULTRAHIGH VACUUM SPUTTERING SYSTEM;

JOSEPHSON JUNCTION DEVICES;

EID: 0035268102     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919287     Document Type: Conference Paper

References (7)

1. RSFQ logic/memory family: A new Josephson-junction technology for sub-terahertz-clock-frequency digital systems
2. An all refractory NbN Josephson junction medium scale integrated circuit process
3. An improved NbN integrated circuit process featuring thick NbN ground plane and lower parasitic circuit inductances
4. All-NbN single flux quantum circuits based on NbN/AlN/NbN tunnel junctions
5. Overdamped niobium-nitride junctions for 10 K operation
6. Overdamped NbN Josephson junctions based on Nb/AlOx/Nb trilayer technology
7. Characteristics of high critical current density Josephson junctions with Nb/AlOx/Nb trilayers