On-line measurement of particle size and shape using laser diffraction

Particle and Particle Systems Characterization

Volumn 18, Issue 5-6, 2002, Pages 243-247

  Ma, Zhenhua ^a   Merkus, Henk G ^a   Van Der Veen, Hilda G ^a   Wong, Melvin ^a   Scarlett, Brian ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; DIFFRACTION; GRINDING (COMMINUTION); LASER APPLICATIONS; POWDERS; PROCESS CONTROL;

AZIMUTHAL LIGHT INTENSITY DISTRIBUTIONS; LASER DIFFRACTION; ON LINE MEASUREMENT;

PARTICLE SIZE ANALYSIS;

EID: 0035253276     PISSN: 09340866     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4117(200112)18:5/6<243::AID-PPSC243>3.0.CO;2-4     Document Type: Article

References (8)

1. In-process particle size distribution measurements and control
2. The use of azimuthal intensity variations in diffraction patterns for particle shape characterization
3. New developments in particle characterization by laser diffraction: Size and shape
4. Particle-size analysis by laser diffraction with a complementary metal-oxide semiconductor pixel array
5. Study of a closed circuit jet mill plant using on-line particle size measurements
6. In-line particle size measurement for control of jet milling