In-line particle size measurement for control of jet milling

Particle and Particle Systems Characterization

Volumn 18, Issue 2, 2001, Pages 99-106

  Ma, Zhenhua ^a   Van Der Veen, Hilda ^a   Merkus, Henk G ^a   Scarlett, Brian ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; LASER APPLICATIONS; MILLING (MACHINING); PROCESS ENGINEERING;

JET MILLING CONTROL; PARTICLE SIZE MEASUREMENT; PARTICLE SIZED DISTRIBUTION;

PARTICLE SIZE ANALYSIS;

EID: 0035389119     PISSN: 09340866     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4117(200107)18:2<99::AID-PPSC99>3.0.CO;2-4     Document Type: Article

References (7)

1. E. Gommeren: Study of a closed circuit jet mill plant using on-line particle size measurements. PhD thesis, Delft University of Technology, 1997.
2. L. H. Thomas, D. J. Holve: In-process particle size distribution measurements and control. Part. Part. Syst. Charact. 10 (1993) 262-265.
3. Z. Ma, H. G. Merkus, B. Scarlett: Particle-size analysis by laser diffraction with a complementary metal-oxide semiconductor pixel array. Appl. Opt. 39 (2000) 1-10.
4. M. Heuer, K. Leschonski: Results obtained with a new instrument for the measurement of particle size distributions from diffraction patterns. Part. Charact. 2 (1985) 7-13.
5. Z. Ma, H. G. Merkus, J. G. A. E. de Smet, C. Heffels, B. Scarlett: New developments in particle characterization by laser diffraction: size and shape. Powder Technol. 111 (2000) 66-78.
6. M. T. Chahine: Inverse problems in radiative transfer: Determination of atmospheric parameters. J. Atmospheric Sci. 27 (1970) 960-967.
7. H. van der Veen: In-line particle size analysis using a CMOS sensor for control of continuous jetmilling. Master's thesis, Delft University of Technology, 2000.