Particle-size analysis by laser diffraction with a complementary metal-oxide semiconductor pixel array

Applied Optics

Volumn 39, Issue 25, 2000, Pages 4547-4556

  Ma, Zhenhua ^a   Merkus, Henk G ^a   Scarlett, Brian ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTROMAGNETIC WAVE DIFFRACTION; OPTICAL RESOLVING POWER; PHOTODIODES; SENSORS; SIGNAL PROCESSING;

LASER DIFFRACTION;

PARTICLE SIZE ANALYSIS;

EID: 0006333731     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.004547     Document Type: Article

References (15)

1. D. Kouzelis, S. M. Candel, E. Esposito, and S. Zikikout, “Particle sizing by laser light diffraction: improvements in optics and algorithms,” Part. Charact. 4, 151-156 (1987).
2. C. Heffels, “On-line particle size and shape characterization by narrow angle light scattering,” Ph.D. dissertation (Delft University of Technology, Delft, The Netherlands, 1995).
3. M. L. Strickland, “Apparatus and method for determining the size distribution of particles by light scattering,” U.S. patent 5,576,827 (19 November 1996).
4. H. C. van de Hulst, Light Scattering by Small Particles (Wiley, New York, 1969).
5. J. H. Chin, C. M. Sliepcevih, and M. Tribus, “Determination of particle size distributions in polydispersed systems,” J. Phys. Chem. 59, 845-848 (1955).
6. K. S. Shifrin and I. B. Kolmakov, “Effect of limitation of the range of measurement of the indicatrix on the accuracy of the small-angle method,” Atmos. Oceanic Phys. 2, 559-561 (1966).
7. S. Twomey, Introduction to the Mathematics of Inversion in Remote Sensing and Indirect Measurements (Elsevier, New York, 1977).
8. A. Boxman, H. G. Merkus, P. J. T. Verherijen, and B. Scarlett, “Deconvolution of light-scattering patterns by observing intensity fluctuations,” Appl. Opt. 30, 4818-4823 (1991).
9. J. Swithenbank, J. M. Beer, D. S. Taylor, D. Abbot, and G. C. McCreath, “A laser diagnostic technique for the measurement of droplet and particle size distribution,” Prog. Astronaut. Aeronaut. 53, 421-447 (1977).
10. M. Heuer and K. Leschonski, “Results obtained with a new instrument for the measurement of particle size distributions from diffraction patterns,” Part. Charact. 2, 7-13 (1985).
11. M. T. Chahine, “Inverse problems in radiative transfer: determination of atmospheric parameters,” J. Atmos. Sci. 27, 960-967 (1970).
12. R. Santer and M. Herman, “Particle size distribution from forward scattered light using the Chahine inversion scheme,”Appl. Opt. 22, 2294-2301 (1983).
13. W. Menke, Geophysical Data Analysis: Discrete Inverse Theory (Academic, New York, 1984).
14. E. D. Hirleman, “Optimal scaling of the inverse Fraunhofer diffraction particle sizing problem: the linear system pro duced by quadrature,” Part. Charact. 4, 128-133 (1987).
15. S. Hayashi, “A laser small-angle scattering instrument for the determination of size and concentration distributions in sprays,” in Liquid Particle Size Measurement Techniques, American Society for Testing and Materials STP Series Volume 1083 (American Society for Testing and Materials, Philadelphia, Pa., 1990), Vol. 2, pp. 77-92.