Characterization of BaTiO3 thin films on p-Si

Materials Science in Semiconductor Processing

Volumn 4, Issue 1-3, 2001, Pages 305-307

  Evangelou, E K ^a   Konofaos, N ^a   Aslanoglou, X ^a   Kennou, S ^b   Thomas, C B ^c  

^a UNIVERSITY OF IOANNINA   (Greece)

^b INSTITUTE OF COMPUTER SCIENCE   (Greece)

^c NOTTINGHAM TRENT UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; CRYSTAL ORIENTATION; LUMINESCENT DEVICES; PHOSPHORS; POLYCRYSTALLINE MATERIALS; RUTHENIUM; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING SILICON; SEMICONDUCTOR GROWTH; SUBSTRATES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

POST THERMAL ANNEALING;

SEMICONDUCTING FILMS;

EID: 0035246956     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-8001(00)00109-8     Document Type: Article

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