X-ray photoelectron spectroscopy study on the composition and structure of BaTiO3 thin films deposited on silicon

Applied Surface Science

Volumn 157, Issue 1, 2000, Pages 14-22

  Nasser, Seif A ^a  

^a BENI SUEF UNIVERSITY   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BARIUM TITANATE; BINDING ENERGY; CRYSTAL ATOMIC STRUCTURE; ELECTRON ENERGY LEVELS; FERROELECTRIC MATERIALS; OXIDATION; SILICON; SOL-GELS; STOICHIOMETRY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

FERROELECTRIC THIN FILMS;

DIELECTRIC FILMS;

EID: 0033886894     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00495-X     Document Type: Article

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