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Volumn 65, Issue 1, 2001, Pages 487-493

Comparative study of rapid and classical thermal phosphorus diffusion on polycrystalline silicon thin films

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; GRAIN SIZE AND SHAPE; PHOSPHORUS; PHOTOVOLTAIC EFFECTS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DOPING; SUBSTRATES; THERMAL DIFFUSION;

EID: 0035202647     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(00)00131-8     Document Type: Article
Times cited : (17)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.