Electrical properties of thick film resistors from noise measurements

Journal of Materials Science Letters

Volumn 16, Issue 13, 1997, Pages 1184-1186

  Peled, A ^a   Kasap, S O ^b   Johanson, R E ^b   Zloof, Y ^c  

^a TEL AVIV UNIVERSITY   (Israel)

^b UNIVERSITY OF SASKATCHEWAN   (Canada)

^c Elta Electronics Industries Ltd   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC RESISTANCE; SIGNAL NOISE MEASUREMENT; THICK FILM DEVICES;

DEBYE SCREENING LENGTH; DIFFUSION COEFFICIENT; DRIFT MOBILITY; MEAN FREE PATH;

RESISTORS;

EID: 0031187843     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf02765405     Document Type: Article

References (7)

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3. M. PRUDENZIATI and R. DELL'ACQUA, "Thick Film Sensors", edited by M. Prudenziati (Elsevier Science, 1994) pp. 85-97.
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