Focused microprobes of high energy ions - versatile analytical probes for surfaces, interfaces and devices

Applied Surface Science

Volumn 169-170, Issue , 2001, Pages 134-141

  Jamieson, David N ^a   Bettiol, Andrew ^a   Yang, Changyi ^b  

^a Univ M   (Australia)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CORROSION; ELECTROMAGNETIC WAVE BACKSCATTERING; HYDROGEN; INTERFACES (MATERIALS); ION BEAMS; SOLAR CELLS; STOICHIOMETRY; SYNTHETIC DIAMONDS; TRACE ANALYSIS; TRACE ELEMENTS;

FILIFORM CORROSION; FOCUSED MICROPROBES;

SURFACE PROPERTIES;

EID: 0035124464     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00737-6     Document Type: Article

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