Recent applications of nuclear microprobe analysis to frontier materials

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 130, Issue 1-4, 1997, Pages 706-716

  Jamieson, David N ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

FRONTIER MATERIALS; ION BEAM INDUCED CHARGE (IBIC); IONOLUMINESCENCE; NUCLEAR MICROPROBE ANALYSIS; PROTON INDUCED X RAY EMISSION (PIXE) ANALYSIS;

CHARGE TRANSFER; CRYSTAL LATTICES; ELECTROMAGNETIC WAVE BACKSCATTERING; ELECTROMAGNETIC WAVE EMISSION; ION BEAMS; LUMINESCENCE; POLYCRYSTALLINE MATERIALS; PROTONS; RADIATION DETECTORS; SINGLE CRYSTALS; TRANSPORT PROPERTIES; X RAY ANALYSIS;

NUCLEAR INSTRUMENTATION;

EID: 0031548958     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00183-3     Document Type: Article

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