Grazing-incidence small-angle X-ray scattering on nanosized vanadium oxide and V/Ce oxide films

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 79, Issue 1, 2001, Pages 11-15

  Turkovic A ^a   Crnjak Orel, Z ^b   Dubcek P ^a,c  

^a RUDER BO KOVI INSTITUTE   (Croatia)

^b NATIONAL INSTITUTE OF CHEMISTRY   (Slovenia)

^c SINCROTRONE TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; GRAIN SIZE AND SHAPE; PROTECTIVE COATINGS; SOL-GELS; SUBSTRATES; THIN FILMS; VANADIUM COMPOUNDS; X RAY SCATTERING;

GRAZING-INCIDENCE SMALL-ANGLE X RAY SCATTERING; SOL-GEL DIP-COATING PROCESS;

NANOSTRUCTURED MATERIALS;

EID: 0035089224     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(00)00528-6     Document Type: Article

References (28)

1. C.G. Granquist, 'Handbook of Inorganic Electrochromic Materials', Amsterdam: Elsevier, 1995.
2. Crnjak-Orel Z. Solid-State Ion. 116:1999;105-116.
3. Crnjak-Orel Z., Muševic I. NanoStruct. Mater. 12:1999;399-404.
4. A. Turković, V. Vraneša, in: M.A. Dorgham (Ed.), The First European East-West Symposium on Materials and Processes, Helsinki, Finland, 1990, International Journal of Materials and Product Technology, Interscience, UNESCO, vol. 7, no. 1, 1992, pp. 51-55.
5. O'Regan B., Grätzel M. Nature. 353:1991;737.
6. Turković A., Zorc H., Kontrec D., Vraneša V. Strojarstvo. 38:(6):1996;257-260.
7. Turković A., Crnjak-Orel Z. Solar Energy Mater. Solar Cells. 45/3:1997;275-281.
8. Amenitsch H., Bernstorff S., Laggner P. Rev. Sci. Instrum. 66:1995;1624.
9. H. Amenitsch, M. Rappolt, M. Kriechbaum, H. Mio, P. Laganer, S. Bernstorff, Small Angle X-ray Scattering -Beamline at ELETTRA: A New Powerful Station for structural Investigations with Synchrotron Radiation, Book of abstracts: Sixth Croatian-Slovenian Crystallographic Meeting, 56, Umag, Croatia, 1997.
10. Levine J.R., Cohen J.B., Chung Y.W., Georgopoulos P. J. Appl. Cryst. 22:1989;528.
11. Naudon A., Thiaudiere D. Surface Coating Technol. 79:(1):1996;103.
12. Thiaudiere D., Naudon A. J. Physique IV. 6:(C4):1996;553.
13. Naudon A., Thiaudiere D. J. Appl. Crystall. 30:((2 Part 5)):1997;822.
14. P. Dubček, O. Milat, M. Lučić-Lavčević, A. Turković, B. Etlinger, H.Amenitsch, Small Angle Xray Scattering and X-ray reflection on Thin Films, Book of Abstracts: Sixth Croatian-Slovenian Crystallographic Meeting, 57, Umag, Croatia, 1997.
15. 2 Measured at ELETTRA, Book of Abstracts: Sixth Croatian-Slovenian Crystallographic Meeting, 58, Umag, Croatia, 1997.
16. Lučić-Lavčević M., Dubček P., Milat O., Etlinger B., Turković A., Šokčević D., Amenitsch H. Mater. Lett. 36:1998;56-60.
17. Turković A., Lučić-Lavčević M., Drašner A., Dubček P., Milat O., Etlinger B., Amenitsch H., Rappolt M. Mater. Sci. Eng. B. 54:1998;174-181.
18. Turković A. Mater. Sci. Eng. B. 75:2000;85-91.
19. Turković A., Dubček P., Bernstorff S. Mater. Sci. Eng. B. 58:1999;263-269.
20. Turković A., Dubček P., Crnjak-Orel Z., Bernstorff S. Nanostruct. Mater. 11:(7):1999;909-915.
21. Ohkura K., Kashino S., Haisa M. Bull. Chem. Soc. Jpn. 45:1972;2651.
22. Guinier A. Ann. Phys. Paris. 12:1939;161.
23. Porod G. Kolloid Z. 124:1951;83.
24. Porod G. Kolloid Z. 125:1952;108.
25. Porod G. Kolloid Z. 133:1953;51.
26. Turković A., Ivanda M., Popović S., Tonejc A.M., Gotić M., Dubček P., Musić S. J. Mol. Struct. 410-411:1997;271-273.
27. Martin J.E., Hurd A.J. J. Appl. Cryst. 20:1987;61.
28. Sing K.S.W., Everatt D.H., Haul R.A.W., Moscou L., Pierotti R.A., Rouquerol J., Siemieniewska T. Pure Appl. Chem. 57:1985;603.