Grazing-incidence small-angle and wide-angle scattering of synchrotron radiation on nanosized CeO2 thin films

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 58, Issue 3, 1999, Pages 263-269

  Turković, Aleksandra ^a   Dubček, Pavo ^a,b   Bernstorff, Sigrid ^b  

^a RUDER BO KOVI INSTITUTE   (Croatia)

^b SINCROTRONE TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

FILM PREPARATION; GLASS; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; SURFACE STRUCTURE; SYNCHROTRON RADIATION; X RAY SCATTERING;

GRAZING INCIDENCE SMALL ANGLE X RAY SCATTERING; WIDE ANGLE X RAY SCATTERING;

CERIUM COMPOUNDS;

EID: 0033614231     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(98)00561-3     Document Type: Article

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