Grazing-incidence SAXS/WAXD on nanosized TiO2 films obtained by ALE

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 75, Issue 1, 2000, Pages 85-91

  Turkovic A ^a  

^a RUDER BO KOVI INSTITUTE   (Croatia)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; FRACTALS; GLASS; GRAIN SIZE AND SHAPE; SUBSTRATES; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

ATOMIC LAYER EPITAXY (ALE); SMALL-ANGLE X RAY SCATTERING (SAXS); WIDE-ANGLE X RAY DIFFRACTION (WAXD) ANALYSIS;

CERAMIC COATINGS;

EID: 0033890605     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(00)00421-9     Document Type: Article

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