Near-field fluorescence imaging and simultaneous observation of surface potentials

Journal of Microscopy

Volumn 202, Issue 2, 2001, Pages 413-419

  Kwak, K J ^a   Hosokawa, T ^a   Yamamoto, N ^b   Muramatsu, H ^b   Fujihira, M ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b SEIKO INSTRUMENTS INC   (Japan)

Author keywords

Langmuir Blodgett film; Phospholipid; Scanning Maxwell stress microscopy; Scanning near field optical microscopy; Surface potential; Thin step etched optical fibre probe

Indexed keywords

ATOMIC FORCE MICROSCOPY; FLUORESCENCE IMAGING; LANGMUIR BLODGETT FILMS; MICROSCOPES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL FIBERS; PROBES; SURFACE POTENTIAL;

ATOMIC FORCE; ETCHED OPTICAL FIBERS; FLUORESCENCE INTENSITIES; NEAR-FIELD FLUORESCENCE; OPTICAL FIBER PROBE; SCANNING MAXWELL-STRESS MICROSCOPIES; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SIMULTANEOUS OBSERVATION; THIN-STEP ETCHED OPTICAL FIBER PROBE;

PHOSPHOLIPIDS;

DIPALMITOYLPHOSPHATIDYLETHANOLAMINE; LIPID; NITROBENZOIC ACID DERIVATIVE; PHOSPHOLIPID;

ARTICLE; ATOMIC FORCE MICROSCOPY; FILM; FLUORESCENCE; HUMIDITY; MOLECULE; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SURFACE CHARGE; TEMPERATURE;

EID: 0035064156     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00796.x     Document Type: Article

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