Multi-functional SNOM/AFM probe with accurately controlled low spring constant

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 73-79

  Muramatsu, Hiroshi ^a   Chiba, Norio ^a   Yamamoto, Noritaka ^a   Homma, Katsunori ^a   Ataka, Tatsuaki ^a   Shigeno, Masatsugu ^a   Monobe, Hirosato ^b   Fujihira, Masamichi ^b  

^a SEIKO INSTRUMENTS INC   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

AFM; Cantilever; Friction image; Near field optics; Optical fiber; Probe; Spring constant

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGING SYSTEMS; LANGMUIR BLODGETT FILMS; LIQUIDS; OPTICAL FIBERS; OPTICAL MICROSCOPY; PERFORMANCE; PHOTOSENSITIVITY;

CANTILEVER; FRICTION IMAGE; NEAR FIELD OPTICS; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SPRING CONSTANT;

PROBES;

ACCURACY; ARTICLE; ATOMIC FORCE MICROSCOPY; CONTROL SYSTEM; FIBEROSCOPE; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SENSOR;

EID: 0032033559     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00112-5     Document Type: Article

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