Characterization of SrBi2Ta2O9 films prepared by metalorganic decomposition using rapid thermal annealing

Integrated Ferroelectrics

Volumn 33, Issue 1-4, 2001, Pages 253-259

  Ling, Huiqin ^a   Li, Aidong ^a   Wu, Di ^a   Yu, Tao ^a   Zhu, Xinhua ^a   Yin, Xiaobo ^a   Wang, Mu ^a   Liu, Zhiguo ^a   Ming, Naiben ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

Metalorganic decomposition; Rapid thermal annealing; SrBi2Ta2O9

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; DECOMPOSITION; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; MORPHOLOGY; OXYGEN; RAPID THERMAL ANNEALING; STRONTIUM COMPOUNDS; STRUCTURE (COMPOSITION); X RAY DIFFRACTION ANALYSIS;

COERCIVE FIELD; CONVENTIONAL TUBE FURNACE; INTERFACIAL DIFFUSION; METALORGANIC DECOMPOSITION METHOD; REMANENT POLARIZATION;

THIN FILMS;

EID: 0035035960     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584580108222307     Document Type: Conference Paper

References (13)