Thickness dependence of the ferroelectric characteristics of SBT and SBTN thin films

Integrated Ferroelectrics

Volumn 33, Issue 1-4, 2001, Pages 235-244

  Park, J D ^a   Oh, T S ^a  

^a Hong Ik University   (South Korea)

Author keywords

Ferroelectric properties; SBT; SBTN; Size effects; Thickness dependence; Thin film

Indexed keywords

CHEMICAL OPERATIONS; FERROELECTRICITY; SIZE DETERMINATION; STRONTIUM COMPOUNDS; THICKNESS MEASUREMENT;

COERCIVE FIELD; RELATIVE PERMITTIVITY; REMANENT POLARIZATION; SIZE EFFECTS; THICKENESS DEPENDENCE;

THIN FILMS;

EID: 0035027039     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584580108222305     Document Type: Conference Paper

References (17)