Structural observation of PZT system film in the use of pulsed-laser deposition method

Journal of the European Ceramic Society

Volumn 21, Issue 10-11, 2001, Pages 1557-1560

  Ichiki, M ^a   Ricinschi, D ^b   Wang, Z ^c   Morikawa, Y ^a   Tanaka, M ^a   Maeda, R ^a   Okuyama, M ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

Electron microscopy; Films; PLZT; PZT; X ray methods

Indexed keywords

CRYSTAL STRUCTURE; LEAD COMPOUNDS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

FILM FORMATION;

PULSED LASER DEPOSITION;

CERAMICS;

EID: 0034887612     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(01)00063-2     Document Type: Article

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