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Volumn 649, Issue , 2001, Pages
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3D FIB and AFM mapping on nanoindentation zones
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPUTER APPLICATIONS;
COPPER;
DEFORMATION;
IMAGE ANALYSIS;
IMAGE RECONSTRUCTION;
INDENTATION;
INTERFACES (MATERIALS);
ION BEAMS;
METALLIC FILMS;
MICROSTRUCTURE;
TITANIUM;
FOCUSED ION BEAM;
ION INDUCED SECONDARY ELECTRONS;
MATERIAL FLOW;
METAL MULTILAYER COATINGS;
NANOINDENTATION;
SUBSURFACE MICROSTRUCTURE;
MULTILAYERS;
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EID: 0034874436
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (2)
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References (10)
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