In-contact dynamics of atomic force microscopes

IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM

Volumn 2, Issue , 2001, Pages 1325-1328

  El Rifai, O M ^a   Youcef Toumi, K ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DAMPING; FEEDBACK CONTROL; PROBES; SCANNING ELECTRON MICROSCOPY; SYSTEM STABILITY; VAN DER WAALS FORCES;

SAMPLE SURFACE TOPOGRAPHY;

MECHATRONICS;

EID: 0034858378     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. Dynamics of piezoelectric tube scanners for scanning probe microscopy
2. Transient responses of a piezoelectric tube scanner
3. Oscillation of the cantilever in atomic force microscopy: Probing the sample response at the microsecond scale
4. Harmonic response of near-contact scanning force microscopy
5. Dynamics of contact-mode atomic force microscopes
6. Coupling in piezoelectric tube scanners used in scanning probe microscopes
7. On factors affecting the performance of atomic force microscopes in contact-mode
8. Adhesion of spheres: The JKR-DMT transition using a Dugdale model