Sub-picosecond optical damaging of silica: Time resolved measurements of light induced damage threshold

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4347, Issue , 2001, Pages 212-222

  Juodkazis, S ^a   Marcinkevicius A ^a   Watanabe, M ^a   Mizeikis, V ^a   Matsuo, S ^a   Misawa, H ^a  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

Defects; Light induced damage threshold; Silica; Time resolved measurements

Indexed keywords

CHARGE CARRIERS; COMPUTER SIMULATION; LASER DAMAGE; LASER PULSES; LIGHT INTERFERENCE; POLARIZATION; THERMAL EFFECTS;

OPTICAL DAMAGING;

SILICA;

EID: 0034855966     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.425013     Document Type: Conference Paper

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