Single-beam photothermal microscopy - a new diagnostic tool for optical materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3578, Issue , 1999, Pages 604-613

  Wu, Z L ^a   Feit, M D ^a   Kozlowski, Mark ^a   Natoli, J Y ^a   Rubenchik, A M ^a   Sheehan, L ^a   Yan, M ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; FUSED SILICA; HAFNIUM COMPOUNDS; LIGHT ABSORPTION; LIGHT SCATTERING; MICROSCOPIC EXAMINATION; MULTILAYERS; NONDESTRUCTIVE EXAMINATION; OPTICAL COATINGS; OPTICAL GLASS; PUMPING (LASER);

HAFNIA; LASER MODULATED SCATTERING (LMS); SINGLE-BEAM PHOTOTHERMAL MICROSCOPY;

LASER DAMAGE;

EID: 0032668177     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.344423     Document Type: Conference Paper

References (22)