|
Volumn 13, Issue 8, 2001, Pages 2608-2612
|
Structural characterization of tin and molybdenum oxides thin films deposited by RGTO
|
Author keywords
[No Author keywords available]
|
Indexed keywords
MOLYBDENUM COMPLEX;
MOLYBDENUM OXIDE;
TIN;
UNCLASSIFIED DRUG;
ARTICLE;
CHEMICAL STRUCTURE;
ENERGY DISPERSIVE X RAY SPECTROSCOPY;
FILM;
GLANCING INCIDENCE X RAY DIFFRACTION;
HUMIDITY;
OXIDATION;
RAMAN SPECTROMETRY;
RHEOTHAXIAL GROWTH AND THERMAL OXIDATION;
SCANNING ELECTRON MICROSCOPY;
SENSOR;
TEMPERATURE MEASUREMENT;
X RAY DIFFRACTION;
X RAY SPECTROMETRY;
|
EID: 0034845567
PISSN: 08974756
EISSN: None
Source Type: Journal
DOI: 10.1021/cm010058s Document Type: Article |
Times cited : (10)
|
References (18)
|