Oxidation of Sn thin films to SnO2. Micro-Raman mapping and X-ray diffraction studies

Journal of Materials Research

Volumn 13, Issue 9, 1998, Pages 2457-2460

  Sangaletti, Luigi ^a   Depero, Laura E ^a   Allieri, Brigida ^a   Pioselli, Francesca ^a   Comini, Elisabetta ^a   Sberveglieri, Giorgio ^a   Zocchi, Marcello ^a  

^a UNIVERSITY OF BRESCIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ANNEALING; OXIDATION; RAMAN SPECTROSCOPY; THIN FILMS; TIN; TIN COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

PHASE SEGREGATION; TIN OXIDE;

METALLIC FILMS;

EID: 0032166040     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1998.0343     Document Type: Article

References (8)