About the number of records to be acquired for histogram testing of A/D converters using synchronous sinewave and clock generators

Computer Standards and Interfaces

Volumn 22, Issue 4, 2000, Pages 253-259

  Chiorboli, Giovanni ^a   Morandi, Carlo ^a  

^a UNIVERSITY OF PARMA   (Italy)

Author keywords

Analog digital conversion; Histogram testing; Uncertainty evaluation

Indexed keywords

EID: 0003085581     PISSN: 09205489     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5489(00)00043-X     Document Type: Article

References (6)

1. Dynamic performance testing of A to D converters, Hewlett Packard product note 5180A-2, Hewlett Packard Co., 1982.
2. J. Doernberg, H.-S. Lee, D.A. Hodges, Full speed testing of A/D converters, IEEE Journal of Solid State Circuits SC-19 (1984) 820-827, December.
3. M. Vanden Bossche, J. Schoukens, J. Renneboog, Dynamic testing and diagnosis of A/D converters, IEEE Transactions on Circuits and Systems CAS-33 (1986) 775-785, August.
4. J. Blair, Histogram measurement of ADC nonlinearities, IEEE Transactions on Instrumentation and Measurement 43 (1994) 373-383, June.
5. IEEE Standard for digitizing waveform recorders, IEEE Std 1057-1994, IEEE Inc., December 1994.
6. ADC sinewave histogram testing with quasi-coherent sampling, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, IMTC2000, 1-4 May 2000 Baltimore, Maryland.