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Volumn 384, Issue 2, 2001, Pages 173-176

High temperature annealing of hydrogenated amorphous silicon carbide thin films

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ANNEALING; EPITAXIAL GROWTH; FILM GROWTH; HIGH TEMPERATURE EFFECTS; HYDROGENATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR GROWTH; SILICON CARBIDE; THIN FILMS;

EID: 0034818407     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01867-8     Document Type: Article
Times cited : (15)

References (15)
  • 15
    • 85031479250 scopus 로고    scopus 로고
    • note
    • JCPDS, For 3C-SiC powder, the relative X-ray diffraction intensity ratios of (200) and (220) peaks to (111) are 0.17 and 0.35, respectively. International Center for Diffraction Data (1998).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.