|
Volumn , Issue , 2001, Pages 479-480
|
Material gain comparison for InGaAsP, AlGaInAs and InGaAsN for 1.3 micron laser diode
a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
CARRIER CONCENTRATION;
ELECTRON TRANSITIONS;
ELECTRONIC DENSITY OF STATES;
ENERGY GAP;
GAIN MEASUREMENT;
LASER APPLICATIONS;
PHOTONS;
PROBABILITY;
SECOND HARMONIC GENERATION;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTOR LASERS;
THRESHOLD VOLTAGE;
CONDUCTION BANDS;
SEMICONDUCTING INDIUM GALLIUM ARSENIDE;
|
EID: 0034805240
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/cleo.2001.948067 Document Type: Conference Paper |
Times cited : (7)
|
References (7)
|