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Journal of Analytical Atomic Spectrometry

Volumn 16, Issue 6, 2001, Pages 598-602

Determination of the stoichiometry and trace impurities in thin barium strontium titanate perovskite layers by inductively coupled plasma-mass spectrometry

(3) Boulyga, S F a Dietze, H J a Becker, J S a

a FORSCHUNGSZENTRUM JÜLICH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CONCENTRATION (PROCESS); DIFFUSION; DISSOLUTION; INDUCTIVELY COUPLED PLASMA; MASS SPECTROMETRY; PEROVSKITE; SILICON; STOICHIOMETRY; X RAY ANALYSIS;

HEXAPOLE COLLISION CELL; OPTICAL EMISSION SPECTROSCOPY; RELATIVE STANDARD DEVIATION; TRACE IMPURITIES; X RAY FLUORESCENCE ANALYSIS;

BARIUM COMPOUNDS;

EID: 0034743024 PISSN: 02679477 EISSN: None Source Type: Journal
DOI: 10.1039/b101339o Document Type: Article

Times cited : (15)

References (15)

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