-
1
-
-
0032496925
-
Introducing chemical-transport selectivity into gold nanotubule membranes
-
Hulteen J.C., Jirage K.B., Martin C.R. Introducing chemical-transport selectivity into gold nanotubule membranes. J. Am. Chem. Soc. 120:1998;6603.
-
(1998)
J. Am. Chem. Soc.
, vol.120
, pp. 6603
-
-
Hulteen, J.C.1
Jirage, K.B.2
Martin, C.R.3
-
2
-
-
0030700615
-
Nanotubule-based molecular filtration membranes
-
Jirage K.B., Hulteen J.C., Martin C.R. Nanotubule-based molecular filtration membranes. Science. 278:1997;655.
-
(1997)
Science
, vol.278
, pp. 655
-
-
Jirage, K.B.1
Hulteen, J.C.2
Martin, C.R.3
-
3
-
-
0001530872
-
Orthogonal self-assembled monolayers: Alkanethiols on gold and alkane carboxylic-acids on alumina
-
Labinis P.E., Hickman J.J., Wrighton M.S., Whitesides G.M. Orthogonal self-assembled monolayers: alkanethiols on gold and alkane carboxylic-acids on alumina. Science. 245:1989;845.
-
(1989)
Science
, vol.245
, pp. 845
-
-
Labinis, P.E.1
Hickman, J.J.2
Wrighton, M.S.3
Whitesides, G.M.4
-
5
-
-
0000423107
-
Interactions and penetration at metal/self-assembled monolayer interfaces
-
Jung D.R., Czanderna A.W., Herdt G.C. Interactions and penetration at metal/self-assembled monolayer interfaces. J. Vac. Sci. Technol. A. 14:1996;1779.
-
(1996)
J. Vac. Sci. Technol. a
, vol.14
, pp. 1779
-
-
Jung, D.R.1
Czanderna, A.W.2
Herdt, G.C.3
-
6
-
-
0000881969
-
In situ monitoring of atomic layer controlled pore reduction in alumina tubular membranes using sequential surface reactions
-
Berland B.S., Gartland I.P., Ott A.W., George S.M. In situ monitoring of atomic layer controlled pore reduction in alumina tubular membranes using sequential surface reactions. Chem. Mater. 10:1998;67.
-
(1998)
Chem. Mater.
, vol.10
, pp. 67
-
-
Berland, B.S.1
Gartland, I.P.2
Ott, A.W.3
George, S.M.4
-
8
-
-
0001044273
-
Surface effects on cation transport across porous alumina membranes
-
Bluhm E.A., Bauer E., Chamberlin R.M., Abney K.D., Young J.S., Jarvinen G.D. Surface effects on cation transport across porous alumina membranes. Langmuir. 15:1999;8668.
-
(1999)
Langmuir
, vol.15
, pp. 8668
-
-
Bluhm, E.A.1
Bauer, E.2
Chamberlin, R.M.3
Abney, K.D.4
Young, J.S.5
Jarvinen, G.D.6
-
9
-
-
0031557361
-
Characterization of surface topography by SEM and SFM: Problems and solutions
-
Castle J.E., Ahdan P.A. Characterization of surface topography by SEM and SFM: problems and solutions. J. Phys. D-Appl. Phys. 30:1997;722.
-
(1997)
J. Phys. D-Appl. Phys.
, vol.30
, pp. 722
-
-
Castle, J.E.1
Ahdan, P.A.2
-
10
-
-
0032517366
-
Separation of acetone/water mixtures by a modified γ-alumina membrane via a new method
-
Li W., Xu X. Separation of acetone/water mixtures by a modified γ-alumina membrane via a new method. J. Membr. Sci. 149:1998;21.
-
(1998)
J. Membr. Sci.
, vol.149
, pp. 21
-
-
Li, W.1
Xu, X.2
-
11
-
-
0031577857
-
Ceramic membrane characterization via the bubble point technique
-
Jakobs E., Koros W.J. Ceramic membrane characterization via the bubble point technique. J. Membr. Sci. 124:1997;149.
-
(1997)
J. Membr. Sci.
, vol.124
, pp. 149
-
-
Jakobs, E.1
Koros, W.J.2
-
12
-
-
0022276756
-
Rutherford backscattering spectrometry
-
Perriere J. Rutherford backscattering spectrometry. Vacuum. 37:1987;429.
-
(1987)
Vacuum
, vol.37
, pp. 429
-
-
Perriere, J.1
-
13
-
-
0003419936
-
-
Materials Research Society, Pittsburgh
-
J.R. Tesmer, M. Nastasi, J.C. Barbour, C.J. Maggiore, J.W. Mayer, Handbook of Modern Ion Beam Analysis, Materials Research Society, Pittsburgh, 1995.
-
(1995)
Handbook of Modern Ion Beam Analysis
-
-
Tesmer, J.R.1
Nastasi, M.2
Barbour, J.C.3
Maggiore, C.J.4
Mayer, J.W.5
-
14
-
-
4244091039
-
Ion scattering from 0.1 keV to 10 MeV: A brief review
-
O'Connor D.J. Ion scattering from 0.1 keV to 10 MeV: a brief review. Mikrochim. Acta. 120:1995;159.
-
(1995)
Mikrochim. Acta
, vol.120
, pp. 159
-
-
O'Connor, D.J.1
-
15
-
-
0032109003
-
Pore structure investigations in porous silicon by ion beam analytical methods
-
Paszti F., Szilagyi E. Pore structure investigations in porous silicon by ion beam analytical methods. Vacuum. 50:1998;451.
-
(1998)
Vacuum
, vol.50
, pp. 451
-
-
Paszti, F.1
Szilagyi, E.2
-
16
-
-
0031121459
-
Technology and RBS analysis of porous silicon light-emitting diodes
-
Lang W., Kozlowski F., Steiner P., Knoll B., Wiedenhofer A., Kollewe D., Bachmann T. Technology and RBS analysis of porous silicon light-emitting diodes. Thin Solid Films. 297:1997;268.
-
(1997)
Thin Solid Films
, vol.297
, pp. 268
-
-
Lang, W.1
Kozlowski, F.2
Steiner, P.3
Knoll, B.4
Wiedenhofer, A.5
Kollewe, D.6
Bachmann, T.7
-
17
-
-
0001883780
-
Chemical vapor deposition of metals and metal silicides on the internal surfaces of porous silicon
-
Anderson D.G., Anwar N., Aylett B.J., Earwaker L.G., Nasir M.I., Farr J.P.G., Stiebahl K., Keen J.M. Chemical vapor deposition of metals and metal silicides on the internal surfaces of porous silicon. J. Organomet. Chem. 437:1992;C7.
-
(1992)
J. Organomet. Chem.
, vol.437
, pp. 7
-
-
Anderson, D.G.1
Anwar, N.2
Aylett, B.J.3
Earwaker, L.G.4
Nasir, M.I.5
Farr, J.P.G.6
Stiebahl, K.7
Keen, J.M.8
-
18
-
-
0030169772
-
Ion beam mixing at copper/alumina interfaces using marker geometry
-
Neubeck K., Hahn H., Balogh A.G., Hausner R., Baumann H., Bethge K., Ruck D.M. Ion beam mixing at copper/alumina interfaces using marker geometry. Nucl. Instr. Methods Phys. Res. B. 113:1996;186.
-
(1996)
Nucl. Instr. Methods Phys. Res. B
, vol.113
, pp. 186
-
-
Neubeck, K.1
Hahn, H.2
Balogh, A.G.3
Hausner, R.4
Baumann, H.5
Bethge, K.6
Ruck, D.M.7
-
19
-
-
0040081410
-
Amorphous, glassy, and porous semiconductors
-
Belyakov L.V., Makarova T.L., Sakharov V.I., Serenkov I.T., Sreseli O.M. Amorphous, glassy, and porous semiconductors. Semiconductors. 32:1998;1003.
-
(1998)
Semiconductors
, vol.32
, pp. 1003
-
-
Belyakov, L.V.1
Makarova, T.L.2
Sakharov, V.I.3
Serenkov, I.T.4
Sreseli, O.M.5
-
20
-
-
0025505793
-
Ion beam analysis of silica sol-gel films: Structural and compositional evaluation
-
Keddie J.L., Giannelis E.P. Ion beam analysis of silica sol-gel films: structural and compositional evaluation. J. Am. Ceram. Soc. 73:1990;3106.
-
(1990)
J. Am. Ceram. Soc.
, vol.73
, pp. 3106
-
-
Keddie, J.L.1
Giannelis, E.P.2
-
21
-
-
84986364867
-
Ion-beam-induced densification of zirconia sol-gel thin films
-
Levine T.E., Keddie J.L., Revesz P., Mayer J.W., Giannelis E.P. Ion-beam-induced densification of zirconia sol-gel thin films. J. Am. Ceram. Soc. 76:1993;1369.
-
(1993)
J. Am. Ceram. Soc.
, vol.76
, pp. 1369
-
-
Levine, T.E.1
Keddie, J.L.2
Revesz, P.3
Mayer, J.W.4
Giannelis, E.P.5
-
22
-
-
0026140777
-
Analysis of depth profiles of sol-gel derived multilayer coatings by Rutherford backscattering spectrometry and by cross-sectional transmission electron microscopy
-
Schutte C.L., Smith P.M., Whitesides G.M. Analysis of depth profiles of sol-gel derived multilayer coatings by Rutherford backscattering spectrometry and by cross-sectional transmission electron microscopy. J. Mater. Res. 6:1991;835.
-
(1991)
J. Mater. Res.
, vol.6
, pp. 835
-
-
Schutte, C.L.1
Smith, P.M.2
Whitesides, G.M.3
-
23
-
-
0001719060
-
Effect of nitridation rate on the composition and conductivity of titanium nitride films prepared from sol-gel titania
-
Keddie J.L., Li J., Mayer J.W., Giannelis E.P. Effect of nitridation rate on the composition and conductivity of titanium nitride films prepared from sol-gel titania. J. Am. Ceram. Soc. 74:1991;2937.
-
(1991)
J. Am. Ceram. Soc.
, vol.74
, pp. 2937
-
-
Keddie, J.L.1
Li, J.2
Mayer, J.W.3
Giannelis, E.P.4
-
24
-
-
0025723553
-
What does RBS say about an interface?
-
Flagmeyer R. What does RBS say about an interface? Superlattices Microstruct. 9:1991;181.
-
(1991)
Superlattices Microstruct.
, vol.9
, pp. 181
-
-
Flagmeyer, R.1
-
25
-
-
0027698802
-
Characterization of the copper-poly(tetrafluoroethylene) interface
-
Rye R., Arnold G.W., Ricco A.J. Characterization of the copper-poly(tetrafluoroethylene) interface. J. Electrochem. Soc. 140:1993;3233.
-
(1993)
J. Electrochem. Soc.
, vol.140
, pp. 3233
-
-
Rye, R.1
Arnold, G.W.2
Ricco, A.J.3
-
27
-
-
0007860003
-
+ in silicon
-
+ in silicon. Mater. Sci. Eng. B57:1999;92.
-
(1999)
Mater. Sci. Eng.
, vol.57
, pp. 92
-
-
Wang, K.-M.1
Meng, M.-Q.2
Lu, F.3
Shi, B.-R.4
Wang, F.-X.5
Li, W.6
Shen, D.-Y.7
Wang, X.-M.8
-
28
-
-
0004198677
-
-
Academic Press, New York
-
W.K. Chu, J.W. Mayer, M.A. Nicolet, Backscattering Spectrometry, Academic Press, New York, 1978.
-
(1978)
Backscattering Spectrometry
-
-
Chu, W.K.1
Mayer, J.W.2
Nicolet, M.A.3
-
29
-
-
0022075813
-
Algorithms for the rapid simulation of Rutherford backscattering spectra
-
Doolittle J.R. Algorithms for the rapid simulation of Rutherford backscattering spectra. Nucl. Instr. Methods Phys. Res. Sec. B. 9:1985;344.
-
(1985)
Nucl. Instr. Methods Phys. Res. Sec. B
, vol.9
, pp. 344
-
-
Doolittle, J.R.1
-
30
-
-
85041141764
-
-
Kluwer Academic Publishers, Dordrecht, The Netherlands
-
M. Mulder, Basic Principles of Membrane Technology, 2nd Edition, Kluwer Academic Publishers, Dordrecht, The Netherlands, 1998.
-
(1998)
Basic Principles of Membrane Technology, 2nd Edition
-
-
Mulder, M.1
|