![]() |
Volumn 16, Issue 4, 2000, Pages 341-408
|
Applications of x-ray photoelectron spectroscopy and static secondary ion mass spectrometry in surface characterization of copolymers and polymers blends
a a
a
NONE
|
Author keywords
[No Author keywords available]
|
Indexed keywords
COPOLYMER;
POLYMER;
ELECTRON SPECTROSCOPY;
MASS SPECTROMETRY;
POLYMER;
REVIEW;
SURFACE PROPERTY;
X-RAY TECHNIQUE;
CHEMICAL ANALYSIS;
CHEMICAL COMPOSITION;
CRYSTALLIZATION;
MASS SPECTROMETRY;
REVIEW;
ROENTGEN SPECTROSCOPY;
SURFACE PROPERTY;
|
EID: 0034517769
PISSN: 01678299
EISSN: None
Source Type: Journal
DOI: 10.1515/REVCE.2000.16.4.341 Document Type: Review |
Times cited : (30)
|
References (104)
|