SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 26, Issue 6, 1998, Pages 425-432

Quantitative analysis of surface ethylene concentrations in ethylene-propylene polymers using XPS valence bands

(2) Galuska, Alan A a Halverson, D Eric a

a EXXONMOBIL UPSTREAM RESEARCH COMPANY (United States)

Author keywords

Polymer; Quantitative analysis; Valence band; X ray photoelectron spectroscopy; XPS

Indexed keywords

CHEMICAL ANALYSIS; COMPOSITION; CONTAMINATION; COPOLYMERS; ETHYLENE; INTERFACES (MATERIALS); POLYMER BLENDS; POLYOLEFINS; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

ETHYLENE PROPYLENE POLYMERS; QUANTITATIVE ANALYSIS; VALENCE BANDS;

ORGANIC POLYMERS;

EID: 0032070695 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/(SICI)1096-9918(19980515)26:6<425::AID-SIA383>3.0.CO;2-G Document Type: Article

Times cited : (23)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.