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Volumn 21, Issue 12, 2000, Pages 549-551

Dual-gate AlGaN/GaN modulation-doped field-effect transistors with cut-off frequencies fT>60 GHz

Author keywords

[No Author keywords available]

Indexed keywords

BROADBAND AMPLIFIERS; DOPING (ADDITIVES); ELECTRIC BREAKDOWN; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM;

EID: 0034504192     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.887461     Document Type: Article
Times cited : (33)

References (10)
  • 1
    • 33746403823 scopus 로고    scopus 로고
    • GaN-based FET's for microwave power amplification
    • Y.-F. Wu et al., "GaN-based FET's for microwave power amplification," IEICE Trans. Electron., vol. E82-C, pp. 1895-905, 1999.
    • (1999) IEICE Trans. Electron. , vol.E82-C , pp. 1895-1905
    • Wu, Y.-F.1
  • 2
    • 0032001933 scopus 로고    scopus 로고
    • DC and microwave performance of high-current AlGaN/GaN heterostructure field effect transistors grown on p-type SiC substrates
    • A. T. Ping et al., "DC and microwave performance of high-current AlGaN/GaN heterostructure field effect transistors grown on p-type SiC substrates," IEEE Electron Device Lett., vol. 19, pp. 54-56, 1998.
    • (1998) IEEE Electron Device Lett. , vol.19 , pp. 54-56
    • Ping, A.T.1
  • 3
    • 0032668826 scopus 로고    scopus 로고
    • High-power microwave GaN/AlGaN HEMT's on semi-insulating silicon carbide substrate
    • S. T. Sheppard et al., "High-power microwave GaN/AlGaN HEMT's on semi-insulating silicon carbide substrate," IEEE Electron. Device Lett., vol. 20, pp. 161-163, 1999.
    • (1999) IEEE Electron. Device Lett. , vol.20 , pp. 161-163
    • Sheppard, S.T.1
  • 4
    • 0002964703 scopus 로고    scopus 로고
    • High Al-content AlGaN/GaN HEMT's on SiC substrates with very-high power performance
    • IEDM
    • Y. F. Wu et al., "High Al-content AlGaN/GaN HEMT's on SiC substrates with very-high power performance," in IEDM Tech. Dig., 1999, IEDM 99-925.
    • (1999) IEDM Tech. Dig. , pp. 99-925
    • Wu, Y.F.1
  • 5
    • 0343395786 scopus 로고    scopus 로고
    • "Private communication," unpublished
    • N. X. Nguyen, "Private communication," unpublished, 1999.
    • (1999)
    • Nguyen, N.X.1
  • 6
    • 0000843292 scopus 로고
    • Physical limitations on frequency and power parameters of transistors
    • E. O. Johnson, "Physical limitations on frequency and power parameters of transistors," RCA Rev., pp. 163-177, 1965.
    • (1965) RCA Rev. , pp. 163-177
    • Johnson, E.O.1
  • 7
    • 0002165205 scopus 로고
    • The role of the device surface in the high voltage behavior of the GaAs MESFET
    • T. M. Barton and P. H. Ladbrooke, "The role of the device surface in the high voltage behavior of the GaAs MESFET," Solid-State Electron., vol. 29, pp. 807-813, 1986.
    • (1986) Solid-State Electron. , vol.29 , pp. 807-813
    • Barton, T.M.1    Ladbrooke, P.H.2
  • 9
    • 0016558345 scopus 로고
    • GaAs dual-gate Schottky-barrier FET's for microwave frequencies
    • Oct.
    • S. Asai, F. Murai, and H. Kodera, "GaAs dual-gate Schottky-barrier FET's for microwave frequencies," IEEE Trans. Electron Devices, vol. ED-22, pp. 897-904, Oct. 1975.
    • (1975) IEEE Trans. Electron Devices , vol.ED-22 , pp. 897-904
    • Asai, S.1    Murai, F.2    Kodera, H.3
  • 10
    • 0023964105 scopus 로고
    • Comparison of microwave performance between single-gate and dual-gate MODFETs
    • Feb.
    • Y. K. Chen, G. W. Wang, D. C. Radulescu, and L. F. Eastman, "Comparison of microwave performance between single-gate and dual-gate MODFETs," IEEE Electron. Device Lett., vol. 9, pp. 59-61, Feb. 1988.
    • (1988) IEEE Electron. Device Lett. , vol.9 , pp. 59-61
    • Chen, Y.K.1    Wang, G.W.2    Radulescu, D.C.3    Eastman, L.F.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.