Testability analysis of analog circuits via determinant decision diagrams

IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

Volumn E83-A, Issue 12, 2000, Pages 2608-2615

  Tao, P I ^a   Shi, Chuan Jin Richard ^a  

^a University of Washington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DECISION THEORY; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK SYNTHESIS; ERROR ANALYSIS; INTEGRATED CIRCUIT LAYOUT; SENSITIVITY ANALYSIS;

DETERMINANT DECISION DIAGRAMS; SYMBOLIC CIRCUIT ANALYSIS;

VLSI CIRCUITS;

EID: 0034499638     PISSN: 09168508     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)

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