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Volumn 26, Issue 7, 1979, Pages 589-594

A Search Algorithm for the Solution of the Multifrequency Fault Diagnosis Equations

Author keywords

[No Author keywords available]

Indexed keywords

FAULT ANALYSIS;

EID: 0018493528     PISSN: 00984094     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCS.1979.1084657     Document Type: Article
Times cited : (35)

References (14)
  • 1
    • 84939056428 scopus 로고    scopus 로고
    • Report of the industry-joint services automatic test task force
    • San Diego
    • “Report of the industry-joint services automatic test task force,” San Diego, Apr., 1977.
  • 2
    • 0015433059 scopus 로고
    • Fault isolation via components simulation
    • R. Saeks, S. P. Singh, and R. W. Liu, “Fault isolation via components simulation,” IEEE Trans. Circuit Theory, vol. CT-19, pp. 634–640, 1972.
    • (1972) IEEE Trans. Circuit Theory , vol.CT-19 , pp. 634-640
    • Saeks, R.1    Singh, S.P.2    Liu, R.W.3
  • 3
    • 84939056197 scopus 로고
    • A functional approach to fault analysis in linear systems
    • Eds. R. Saeks and S. R. Liberty, Eds. New York: Marcel Dekker
    • M. N. Ransom and R. Saeks, “A functional approach to fault analysis in linear systems,” in Rational Fault Analysis, Eds. R. Saeks and S. R. Liberty, Eds. New York: Marcel Dekker, 1977, 124–134.
    • (1977) Rational Fault Analysis , pp. 124-134
    • Ransom, M.N.1    Saeks, R.2
  • 4
    • 0010971707 scopus 로고
    • A survey of some closed methods for inverting matrices
    • A. S. Householder “A survey of some closed methods for inverting matrices”, SIAM J. Appl. Math., vol. 5, pp. 155–169, 1957.
    • (1957) SIAM J. Appl. Math. , vol.5 , pp. 155-169
    • Householder, A.S.1
  • 5
    • 0017675041 scopus 로고
    • Efficient methods for fault simulation
    • Aug. Texas Tech Univ.
    • G. C. Temes, “Efficient methods for fault simulation,” Proc. 20th Midwest Symp. Circuits Syst. Texas Tech Univ., pp. 191–194, Aug. 1977.
    • (1977) Proc. 20th Midwest Symp. Circuits Syst , pp. 191-194
    • Temes, G.C.1
  • 6
    • 0016561590 scopus 로고
    • Multiparameter large-change sensitivity analysis and systematic exploration
    • K. H. Leung and R. Spence, “Multiparameter large-change sensitivity analysis and systematic exploration,” IEEE Trans. Circuits Syst., vol. CAS-22, pp. 796–804, 1975.
    • (1975) IEEE Trans. Circuits Syst. , vol.CAS-22 , pp. 796-804
    • Leung, K.H.1    Spence, R.2
  • 7
    • 84939004848 scopus 로고    scopus 로고
    • M.S. thesis, Texas Tech University. Lubbock, TX
    • H. S. M., Chen M.S. thesis, Texas Tech University, Lubbock, TX, 1977.
    • Chen, H.S.M.1
  • 10
    • 84939055605 scopus 로고    scopus 로고
    • M.S. thesis Texas Tech University. Lubbock, TX.
    • N. Sen, M.S. thesis, Texas Tech University, Lubbock, TX., 1977.
    • Sen, N.1
  • 11
    • 84939009857 scopus 로고
    • A measure of testability and its application to test point selection—Computation
    • Nov. Hyannis, MA)
    • N. Sen and R. Saeks “A measure of testability and its application to test point selection—Computation”, Proc. A UTOTESTCON- ‘77, (Hyannis, MA) pp. 212–219, Nov. 1977.
    • (1977) Proc. A UTOTESTCON '77 , pp. 212-219
    • Sen, N.1    Saeks, R.2
  • 12
    • 0017677008 scopus 로고
    • A measure of testability and its application to test point selection—Theory
    • Aug. Texas Tech Univ. Lubbock, TX
    • —, “A measure of testability and its application to test point selection—Theory”, Proc. 20th Midwest Symp. Circuits Syst., Texas Tech Univ., Lubbock, TX, pp. 576–583, Aug. 1977.
    • (1977) Proc. 20th Midwest Symp. Circuits Syst. , pp. 576-583
  • 13
    • 0014923867 scopus 로고
    • MARSYAS—A software package for digital simulation of physical systems
    • H. Trauboth and N. Prasad, “MARSYAS—A software package for digital simulation of physical systems,” Proc. Spg. Joint Comp. Conf., pp. 223–235, 1970.
    • (1970) Proc. Spg. Joint Comp. Conf. , pp. 223-235
    • Trauboth, H.1    Prasad, N.2
  • 14
    • 0018496062 scopus 로고    scopus 로고
    • Fault diagnosis for linear systems via multi-frequency frequency measurements
    • N. Sen and R. Saeks “Fault diagnosis for linear systems via multi-frequency frequency measurements,” this issue, pp. 457–465.
    • this issue , pp. 457-465
    • Sen, N.1    Saeks, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.