Fault Diagnosis for Linear Systems Via Multifrequency Measurements

IEEE Transactions on Circuits and Systems

Volumn 26, Issue 7, 1979, Pages 457-465

  Sen, Neeraj ^a   Saeks, Richard ^b  

^a Datapoint Corporation ^*  (United States)

^b TEXAS TECH UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL TECHNIQUES - TRANSFER FUNCTIONS;

FAULT DIAGNOSIS;

ELECTRIC NETWORKS, LINEAR;

EID: 0018496062     PISSN: 00984094     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCS.1979.1084659     Document Type: Article

References (16)

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3. N. Sen and R. Saeks, “A measure of testability and its application to test point selection—Theory,” Proc. 20th Midwest Symp. Circuits Syst. (Lubbock, TX), pp. 576–583, Aug. 1977.
4. “A Measure of testability and its application to test point selection—Computation,” Proc. 1977 AUTOTESTCON (Hyannis, MA), pp. 2 12–21 9, Nov. 1977.
5. N. Sen, M.S. thesis, Texas Tech Univ., Lubbock, TX, 1977.
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11. H. M. S. Chen, M.S. thesis, Texas Tech Univ., 1977.
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