SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 592, Issue , 2000, Pages 337-343

Measurement technique, oxide thickness and area dependence of soft-breakdown

(5) Nigam, T a Degraeve, R b Groeseneken, G b Heyns, M b Maes, H E b

a LUCENT TECHNOLOGIES (United States)

b IMEC (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRON TRAPS; ELECTRON TUNNELING; EQUIVALENT CIRCUITS; SILICA; THERMAL EFFECTS;

INELASTIC QUANTUM TUNNELING;

GATES (TRANSISTOR);

EID: 0034498003 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.