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Surface Review and Letters

Volumn 7, Issue 4, 2000, Pages 437-446

X-ray diffraction for surfaces and buried interfaces

(1) Renaud, G a

a CEA GRENOBLE (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL STRUCTURE; GEOMETRY; REVIEW; STRUCTURE ANALYSIS; SURFACE PROPERTY; X RAY DIFFRACTION;

EID: 0034492896 PISSN: 0218625X EISSN: None Source Type: Journal
DOI: 10.1016/S0218-625X(00)00045-2 Document Type: Review

Times cited : (3)

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