Growth, annealing and oxidation of the Ni/MgO (001) interface studied by grazing incidence x-ray scattering

Journal of Applied Physics

Volumn 84, Issue 8, 1998, Pages 4259-4267

  Barbier, A ^a   Renaud, G ^a   Robach, O ^a  

^a CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL GROWTH; CRYSTAL ORIENTATION; HIGH TEMPERATURE EFFECTS; LATTICE CONSTANTS; MAGNESIA; NICKEL; OXIDATION; SUBSTRATES; X RAY SCATTERING;

GRAZING INCIDENCE X RAY SCATTERING; LATTICE MISMATCH;

INTERFACES (MATERIALS);

EID: 0032531578     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368643     Document Type: Article

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