Coupling between spatial and angular variables in surface X-ray diffraction: Effects on the line shapes and integrated intensities

Journal of Applied Crystallography

Volumn 33, Issue 6, 2000, Pages 1365-1375

  Jedrecy, Nathalie ^a,b  

^a UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOMIC PARTICLE; GEOMETRY; LIGHT SCATTERING; MEASUREMENT; QUANTITATIVE ASSAY; SURFACE PROPERTY; TECHNIQUE; X RAY DIFFRACTION;

EID: 0034480644     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800012188     Document Type: Article

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