Diffraction analysis of a disordered surface, modelled on a probability distribution of reconstructed blocks: Bi/Si(001)-(2 x n), n = 6.45

Journal of Physics Condensed Matter

Volumn 11, Issue 8, 1999, Pages 1935-1951

  Jedrecy, N ^a,b   Gavioli, L ^c   Mariani, C ^c   Betti, M G ^c   Croset, B ^b   De Beauvais, C ^b  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b CNRS   (France)

^c UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006092565     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/11/8/007     Document Type: Article

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