Low energy electron-excited nanoscale luminescence: A tool to detect trap activation by ionizing radiation

IEEE Transactions on Nuclear Science

Volumn 47, Issue 6 III, 2000, Pages 2276-2280

  White, B D ^a   Brillson, L J ^a   Lee, S C ^b   Fleetwood, D M ^b   Schrimpf, R D ^b   Pantelides, S T ^c   Lee, Y M ^d   Lucovsky, G ^d  

^a Ohio State University   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c VANDERBILT UNIVERSITY   (United States)

^d NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ACTIVATION; CURRENT DENSITY; DIELECTRIC MATERIALS; ELECTRON TRAPS; INTERFACES (MATERIALS); IRRADIATION; LIGHT EMISSION; LUMINESCENCE; SEMICONDUCTING SILICON; SILICA; ULTRATHIN FILMS;

CHARGE DENSITY; LOW ENERGY ELECTRON EXCITED NANOSCALE LUMINESCENCE; SPECTRAL ENERGY; TRAP ACTIVATION; X RAY IRRADIATION;

IONIZING RADIATION;

EID: 0034450488     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.903765     Document Type: Conference Paper

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