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Volumn 74, Issue 1-4, 2000, Pages 373-390
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Mechanical detachment of nanometer particles strongly adhering to a substrate: An application of corrosive tribology
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Author keywords
Crack growth, chemically assisted; Humidity effects; Particle removal; Scanning force microscopy; Work of adhesion Model
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Indexed keywords
CHEMICAL BONDS;
CRACK PROPAGATION;
INTERFACES (MATERIALS);
MICROSCOPIC EXAMINATION;
SINGLE CRYSTALS;
SODIUM CHLORIDE;
SUBSTRATES;
SCANNING PROBE MICROSCOPY;
ADHESION;
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EID: 0034439512
PISSN: 00218464
EISSN: None
Source Type: Journal
DOI: 10.1080/00218460008034537 Document Type: Article |
Times cited : (2)
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References (20)
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