Non-contact characterization of recombination processes in 4H-SiC

Materials Research Society Symposium - Proceedings

Volumn 622, Issue , 2000, Pages

  Matocha, K ^a   Chow, T P ^a   Gutmann, R J ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); HIGH TEMPERATURE OPERATIONS; MICROWAVE MEASUREMENT; PHOTOCONDUCTIVITY;

CARRIER DECAY TRANSIENTS; RECOMBINATION PROCESSES;

SILICON CARBIDE;

EID: 0034431256     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-622-t4.4.1     Document Type: Conference Paper

References (12)